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X-ray Inspection
By Don Naugler
VJ Electronix Inc.
1000 Mount Laurel Circle
Shirley, MA 01464
tel:978-425-9446
fax:978-425-9648
dnaugler@vjt.com
www.vjelectronix.com


What Is Rules Based Thermal Profiling?

Surface mount rework systems today accurately mimic original reflow oven profiles at a localized rework site. Features such as automated profile generation allow the user to quickly define workable profiles for a variety of applications. However, lead-free solder and sensitive components demand more carefully crafted profiles than can be achieved using traditional methods.

Rules Based Thermal Profiling allows automated profile generation with a combination of parameters that are set to meet every situation. Multiple criteria may be specified and prioritized to yield the most reliable process for reworking sensitive components and assemblies. This offers the process engineer the ability to more easily tailor rework processes to satisfy lead-free assembly’s increasingly stringent requirements and still maintain the yields and reliability that are paramount in the current market environment.

What Is Advanced Defect Enhancement?

Traditionally, inspection of X-ray images involved manually adjusting contrast and brightness for different regions of the image. This is done to improve the visibility of low-contrast defects across different thickness and materials, such as voids in solder joints or encapsulants. These manual adjustments result in a long inspection duration and inconsistent decision making across operators, resulting in major cost implications in the production inspection context.

The Advanced Defect Enhancement (ADE) filter is a sophisticated image enhancement tool for automatically adjusting the local contrast and brightness for each region of the X-ray image. Because it completes the enhancement in a single pass, the enhanced image shows practically all defect structures, thus eliminating the need for any manual contrast and brightness adjustment. This directly reduces cost as the inspection duration for each part is significantly decreased. In addition to minimizing reliance on operator competence, ADE results in higher inspection quality because defect visibility is substantially improved.


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Last Updated: June 3, 2005
Copyright © 2005
Publisher: Megan Wendling
Webmaster: David Haskell
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